Indian Council of Agricultural Research
(Agricultural Knowledge Management Information System)


ICAR-Central Institute of Fisheries Technology, CIFT Junction Matsyapuri PO, Cochin-682029, Kerala (www.cift.res.in)
Click Here to See Management Committee
Instrument Details
Instrument/Facility Name: Atomic Force Microscope
Make                                   : Park Systems Corp., Korea
Model                                  : XE -100
Specification   :Park Systems Corp., Korea XE - 100

Click to ViewScanner : 5µm and 100 µm Noise level : 0.02nm Microscope field view: 480 x360 µm

  Working Principles
Click to ViewAtomic Force Microscopy is a method for high resolution surface imaging. The AFM gives us a window into this nanoscale world. It uses a cantilever with a very sharp tip to scan over a sample surface. As the tip approaches the surface, the close-range, attractive force between the surface and the tip cause the cantilever to deflect towards the surface.

  Applications
  User Instructions
Measurement: Surface scanning contact and non contact mode.Sample thickness :1 cm maximum

  Contact Us
Contact No. 0484-2412300
Email Id leelaedwin@gmail.com

  Atomic Force Microscope Charges
Procedure Name
Industry
University
National LAB/R&D
Remark
5000
5000
5000
per sample

Additional Rs 100/-towards postal charges if result are to be posted
The Demand Draft should be in favour of "The Director, ICAR-CIFT, Cochin OR the payment can be made directly at ICAR-CIFT office"
Letter, DD & Samples send to "The Director, ICAR-CIFT, Willingdon Island, Cochin, Kerala-682029 "